Publications
Journal Papers
[J2]
Wei Li, Yuzhe Ma, Yibo Lin, Bei Yu,
“Adaptive Layout Decomposition with Graph Embedding Neural Networks”,
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD).
(preprint).
[J1]
Wei Li, Yuzhe Ma, Qi Sun, Zhang Lu, Yibo Lin, Iris Hui-Ru Jiang, Bei Yu, David Z. Pan,
“OpenMPL: An Open Source Layout Decomposer”,
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD).
(preprint, code).
Conference Papers
[C14]
Chris Nigh, Ruben Purdy, Wei Li, Subhasish Mitra, R.D. Blanton, “Faulty Function Extraction for Defective Circuits”, IEEE European Test Symposium (ETS) 2024.
(preprint).
[C13]
Wei Li, Rongjian Liang, Anthony Agnesina, Haoyu Yang, Chia-Tung Ho, Anand Rajaram, Haoxing Ren, “DGR: Differentiable Global Routing”, ACM/IEEE Design Automation Conference (DAC), San Francisco, 2024.
(preprint). Much appreciation for the guidance and assistance provided by Prof. Hu Jiang on this project.
[C12]
Wei Li, Ruben Purdy, Jose Moura, Shawn Blanton, “Characterize the ability of GNNs in attacking logic locking”, ACM/IEEE Workshop on Machine Learning for CAD (MLCAD), Snowbird, Utah, Sep. 11–13, 2023.
(preprint, appendix).
[C11]
Wei Li, Fangzhou Wang, Jose Moura, Shawn Blanton, “Global floorplanning via semidefinite programming”, ACM/IEEE Design Automation Conference (DAC), San Francisco, July 9-13, 2023.
(preprint, appendix).
Wei Li, Ruxuan Li, Yuzhe Ma, Siu On Chan, David Pan, Bei Yu, “Rethinking Graph Neural Networks for the Graph Coloring Problem”, arXiv preprint:2208.06975.
(arXiv, appendix).
[C10]
Wei Li, Chris Nigh, Danielle Duvalsaint, Subhasish Mitra, R.D. Blanton, “PEPR: Pseudo-Exhaustive Physical Region Testing”, IEEE International Test Conference (ITC), Sep. 25 - Sep. 30, 2022.
(preprint).
[C9]
Wei Li, Guojin Chen, Haoyu Yang, Ran Chen, Bei Yu, “Learning Point Clouds in EDA”, ACM International Symposium on Physical Design (ISPD), Mar. 21–Mar. 24, 2021. (Invited Paper)
(preprint).
[C8]
Wei Li, Yuxiao Qu, Gengjie Chen, Yuzhe Ma, Bei Yu,
“TreeNet: Deep Point Cloud Embedding for Routing Tree Construction”,
IEEE/ACM Asian and South Pacific Design Automation Conference (ASP-DAC), Tokyo, Jan. 18–21, 2021 (Best Paper Award).
(preprint).
[C7]
Wei Li, Jialu Xia, Yuzhe Ma, Jialu Li, Yibo Lin, Bei Yu,
“Adaptive Layout Decomposition with Graph Embedding Neural Networks”,
ACM/IEEE Design Automation Conference (DAC), San Francisco, July 19-23, 2020.
(preprint).
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[C6] Husheng Zhou, Wei Li, Yuankun Zhu, Yuqun Zhang, Bei Yu, Lingming Zhang, Cong Liu, “DeepBillboard: Systematic Physical-World Testing of Autonomous Driving Systems”,
ACM/IEEE International Conference on Software Engineering (ICSE), Seoul, May 23–29, 2020. (arXiv).
[C5]
Yuzhe Ma, Zhuolun He, Wei Li, Tinghuan Chen, Lu Zhang, Bei Yu,
“Understanding Graphs in EDA: From Shallow to Deep Learning”, ACM International Symposium on Physical Design (ISPD), Taipei, Mar. 25–Apr. 01, 2020. (Invited Paper)
(paper).
[C4] Yuzhe Ma, Ran Chen, Wei Li, Fanhua Shang,
Wenjian Yu, Minsik Cho, Bei Yu,
“A Unified Approximation Framework for Deep Neural Networks”, The IEEE International Conference on Tools with Artificial Intelligence (ICTAI) 2019,(Best Student Paper Award)
(arXiv).
[C3]
Wei Li, Yuzhe Ma, Qi Sun, Yibo Lin, Iris Hui-Ru Jiang, Bei Yu, David Z. Pan,
“OpenMPL: An Open Source Layout Decomposer”, IEEE International Conference on ASIC (ASICON), Chongqing, China, Oct. 29–Nov. 1, 2019. (Invited Paper)
(preprint)
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[C2] Xia Li, Wei Li, Yuqun Zhang, Yuqun Zhang, Lingming Zhang “DeepFL: Integrating Multiple Fault Diagnosis Dimensions for Deep Fault Localization”,The ACM SIGSOFT International Symposium on Software Testing and Analysis
(ISSTA), 2019. (Distinguished Paper Award) (arXiv).
[C1] Bentian Jiang, Xiaopeng Zhang, Ran Chen, Gengjie Chen, Peishan Tu, Wei Li, Evangeline F. Y. Young, Bei Yu, “FIT: Fill Insertion Considering Timing”,
ACM/IEEE Design Automation Conference (DAC), Las Vegas, NV, June 2–6, 2019. (preprint)
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